Home Electrical characterization and modeling of Ni/SiNx/InN MIS structures
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Identifier | 000403325 | |||
Title | Electrical characterization and modeling of Ni/SiNx/InN MIS structures | |||
Alternative Title | Ηλεκτρικός χαρακτηρισμός και προσομοίωση δομών Ni/SiNx/InN | |||
Author | Μπελενιώτης, Πέτρος Κ. | |||
Thesis advisor | Γεωργακίλας, Αλέξανδρος | |||
Reviewer |
Ηλιόπουλος, Ελευθέριος
Δεληγεώργης, Γεώργιος |
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Abstract |
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Language | English | |||
Subject | Indium Nitride | |||
MIS capacitor | ||||
MISCAP | ||||
Metal Insulator Semiconductor | ||||
Issue date | 2016-11-18 | |||
Collection | School/Department--School of Sciences and Engineering--Department of Physics--Post-graduate theses | |||
Type of Work--Post-graduate theses | ||||
Views | 540 |
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